[Federal Register Volume 60, Number 204 (Monday, October 23, 1995)]
[Notices]
[Page 54338]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 95-26217]
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DEPARTMENT OF COMMERCE
University of Texas Medical Branch, et al.; Notice of
Consolidated Decision on Applications for Duty-Free Entry of Electron
Microscopes
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be
viewed between 8:30 A.M. and 5:00 P.M. in Room 4211, U.S. Department of
Commerce, 14th and Constitution Avenue, N.W., Washington, D.C.
Docket Number: 95-035. Applicant: University of Texas Medical
Branch, Galveston, TX 77555. Instrument: Electron Microscope, Model
CM100. Manufacturer: Philips, The Netherlands. Intended Use: See notice
at 60 FR 29826, June 6, 1995. Order Date: December 13, 1994.
Docket Number: 95-039. Applicant: Richard L. Roudebush VA Medical
Center, Indianapolis, IN 46202. Instrument: Electron Microscope, Model
CM120. Manufacturer: Philips, The Netherlands. Intended Use: See notice
at 60 FR 29827, June 6, 1995. Order Date: January 20, 1995.
Docket Number: 95-049. Applicant: Auburn University, AL 36849.
Instrument: Electron Microscope, Model JEM-2010. Manufacturer: JEOL
Ltd., Japan. Intended Use: See notice at 60 FR 35552, July 10, 1995.
Order Date: March 14, 1995.
Docket Number: 95-053. Applicant: Georgia Institute of Technology,
Atlanta, GA 30332. Instrument: Electron Microscope, Model HF-2000.
Manufacturer: Hitachi Instruments, Japan. Intended Use: See notice at
60 FR 37051, July 19, 1995. Order Date: March 2, 1993.
Comments: None received. Decision: Approved. No instrument of
equivalent scientific value to the foreign instrument, for such
purposes as these instruments are intended to be used, was being
manufactured in the United States at the time the instruments were
ordered. Reasons: Each foreign instrument is a conventional
transmission electron microscope (CTEM) and is intended for research or
scientific educational uses requiring a CTEM. We know of no CTEM, or
any other instrument suited to these purposes, which was being
manufactured in the United States either at the time of order of each
instrument or at the time of receipt of application by the U.S. Customs
Service.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 95-26217 Filed 10-20-95; 8:45 am]
BILLING CODE 3510-DS-F
