[Federal Register Volume 63, Number 241 (Wednesday, December 16, 1998)]
[Notices]
[Pages 69263-69264]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 98-33333]
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DEPARTMENT OF COMMERCE
International Trade Administration
Applications for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat.
897; 15 CFR part 301), we invite comments on the question of whether
instruments of equivalent scientific value, for the purposes for which
the instruments shown below are intended to be used, are being
manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the
regulations and be filed within 20 days with the Statutory Import
Programs Staff, U.S. Department of Commerce, Washington, D.C. 20230.
Applications may be examined between 8:30 A.M. and 5:00 P.M. in Room
4211, U.S. Department of Commerce, 14th Street and Constitution Avenue,
N.W., Washington, D.C.
Docket Number: 98-059. Applicant: Rutgers, The State University of
New Jersey, Institute of Marine and Coastal Science, 56 Bevier Road,
Piscataway, NJ 08854. Instrument: Current Meter, Model RCM-9.
Manufacturer: Aanderaa Instruments A/S, Norway. Intended Use: The
instrument is intended to be used to measure the flow velocity during
experiments conducted to quantify the nitrogen flux through the
estuary-ocean
[[Page 69264]]
boundary and identify causes for the variability in nitrogen flux.
Application accepted by Commissioner of Customs: November 6, 1998.
Docket Number: 98-060. Applicant: Iowa State University of Science
& Technology, 3616 Administrative Services Building, Ames, IA 50011-
3616. Instrument: Variable Temperature Scanning Tunneling Microscope.
Manufacturer: Omicron Vakuum Physik, Germany. Intended Use: The
instrument will be used for characterization and fundamental studies of
submonolayer to multilayer metal films deposited on metal single
crystal surfaces. The studies will involve depositing metals onto metal
substrates at a given temperature and following the evolution of the
surface structure for time periods as long as 12 hours using the
instrument. The evolution of the films will be studied both during and
after deposition. In addition, the instrument will be used for
educational purposes in the courses Chemistry 576-Surface Chemistry and
Chemistry 699-Research. Application accepted by Commissioner of
Customs: November 19, 1998.
Docket Number: 98-061. Applicant: The University of Chicago,
Operator of Argonne National Laboratory, 9700 S. Cass Avenue, Argonne,
IL 60439. Instrument: Ion Source. Manufacturer: Atomika Instruments,
Germany. Intended Use: The instrument will be used as a desorption
source in depth profiling and trace analysis of a wide variety of
materials ranging from semi-conductor wafers (Si, GaAs, HgCdTe) to
solar wind collector foils of a diamond. The objective of this research
is to analyze near-surface concentrations below one part per trillion
(several orders of magnitude below the current capability anywhere in
the world). Application accepted by Commissioner of Customs: November
24, 1998.
Docket Number: 98-062. Applicant: University of California, Davis,
Department of Applied Science, Institute for Laser Science and
Applications, Lawrence Livermore National Laboratory, 7000 East Avenue,
Livermore, CA 94550. Instrument: Titanium Sapphire Oscillator.
Manufacturer: Femtolasers Produktions, Germany. Intended Use: The
instrument is intended to be used for the study of the interactions of
ultrashort, ultrahigh intensity laser pulses with relativistic electron
beams in vacuum in the following experiments: (a) production of
ultrashort electron bunches in a rf photoinjector for the production of
Coherent Synchroton Radiation in a Free Electron Laser, (b) Vacuum
Laser Acceleration of electron beams using either ``pondermotive
scattering'' or ``chirped pulse inverse free electron lasers'' and (c)
production of short, intense bursts of x-rays using Compton Scattering
for basic and applied physics applications. Application accepted by
Commissioner of Customs: November 24, 1998.
Docket Number: 98-063. Applicant: University of Maryland, Center
for Microanalysis and Microscopy, Department of Materials and Nuclear
Engineering, Building 090, College Park, MD 20742. Instrument: Electron
Microprobe, Model JXA-8900R. Manufacturer: JEOL Ltd., Japan. Intended
Use: The instrument is intended to be used for studies of the chemical
composition and elemental distribution of geological materials,
engineering materials, biologic materials, thin films on substrates,
and the chemistry of various other objects of interest. These studies
will involve experiments consisting of focusing a high voltage electron
beam on a solid sample (usually a polished grain mount or cross-
section, thin section or other ceramic), generating characteristic x-
rays, and measuring these x-rays quantitatively with wavelength and
energy dispersive spectrometers. In addition, the instrument will be
used for hands-on training in operation of the instrument. Application
accepted by Commissioner of Customs: November 24, 1998.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 98-33333 Filed 12-15-98; 8:45 am]
BILLING CODE 3510-DS-P
