[Federal Register Volume 62, Number 74 (Thursday, April 17, 1997)]
[Notices]
[Page 18749]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 97-9964]
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DEPARTMENT OF COMMERCE
International Trade Administration
University of Tennessee, et al.; Notice of Consolidated Decision
on Applications for Duty-Free Entry of Scientific Instruments
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be
viewed between 8:30 A.M. and 5:00 P.M. in Room 4211, U.S. Department of
Commerce, 14th and Constitution Avenue, N.W., Washington, D.C.
Comments: None received. Decision: Approved. No instrument of
equivalent scientific value to the foreign instruments described below,
for such purposes as each is intended to be used, is being manufactured
in the United States.
Docket Number: 96-142. Applicant: University of Tennessee,
Knoxville, Knoxville, TN 37996-1200. Instrument: Energy Analyzer and
Power Supply, Model SES-200. Manufacturer: Scienta Instrument AB,
Sweden. Intended Use: See notice at 62 FR 5619, February 6, 1997.
Reasons: The foreign instrument provides an energy resolution of 5 meV
(Xe gas phase) using a Gammadata VUV-source and nine predefined pass
energies of 2, 5, 10, 20, 40, 75, 150, 300 and 500 eV. Advice received
from: A domestic manufacturer of electron analyzers, March 27, 1997.
Docket Number: 96-143. Applicant: University of Alabama,
Tuscaloosa, AL 35487-0209. Instrument: Auger XPS Spectrometer.
Manufacturer: Kratos Analytical Inc., United Kingdom. Intended Use: See
notice at 62 FR 5620, February 6, 1997. Reasons: The foreign instrument
provides: (1) A combination of magnetic and electrostatic lenses
providing a peak sensitivity of 500 000 cps at 10-9 A beam current, (2)
charge neutralization and (3) digital control of transfer optics,
analyzer, and other instrument functions. Advice received from: A U.S.
Department of Energy laboratory, March 19, 1997.
Docket Number: 96-145. Applicant: Georgia Institute of Technology,
Atlanta, GA 30322-0834. Instrument: Ion-Assisted Deposition System,
Model APS 1104. Manufacturer: Leybold AG, Germany. Intended Use: See
notice at 62 FR 6215, February 11, 1997. Reasons: The foreign
instrument provides: (1) A proprietary plasma source for ion-assisted
deposition, (2) uniform deposition over an area as large as one meter
in diameter and (3) ability to operate with lower substrate
temperatures than conventional electron beam deposition systems. Advice
received from: Brookhaven National Laboratory, March 14, 1997.
A domestic manufacturer of electron analyzers, a U.S. Department of
Energy laboratory and Brookhaven National Laboratory advise that (1)
The capabilities of each of the foreign instruments described above are
pertinent to each applicant's intended purpose and (2) they know of no
domestic instrument or apparatus of equivalent scientific value for the
intended use of each instrument.
We know of no other instrument or apparatus being manufactured in
the United States which is of equivalent scientific value to any of the
foreign instruments.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 97-9964 Filed 4-16-97; 8:45 am]
BILLING CODE 3510-DS-P
