[Federal Register Volume 63, Number 76 (Tuesday, April 21, 1998)]
[Notices]
[Page 19714]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 98-10412]
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DEPARTMENT OF COMMERCE
International Trade Administration
The Ohio State University, et al.; Notice of Consolidated
Decision on Applications for Duty-Free Entry of Electron Microscopes
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be
viewed between 8:30 A.M. and 5:00 P.M. in Room 4211, U.S. Department of
Commerce, 14th and Constitution Avenue, N.W., Washington, D.C.
Docket Number: 97-103. Applicant: The Ohio State University,
Columbus, OH 43210. Instrument: Electron Microscope, Model CM200.
Manufacturer: Philips, The Netherlands. Intended Use: See notice at 63
FR 5364, February 2, 1998. Order Date: July 10, 1997.
Docket Number: 98-005. Applicant: University of California, Davis,
Davis, CA 95618. Instrument: Electron Microscope, Model LEEM III.
Manufacturer: Elmitec Elektronenmikroskopie GmbH, Germany. Intended
Use: See notice at 63 FR 11870, March 11, 1998. Order Date: December 3,
1996.
Docket Number: 98-012. Applicant: University of New Orleans, New
Orleans, LA 70148. Instrument: Electron Microscope, Model JEM-2010.
Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 63 FR
12451, March 13, 1998. Order Date: January 8, 1998.
Docket Number: 98-014. Applicant: University of Wisconsin-Eau
Claire, Eau Claire, WI 54702-4004. Instrument: Electron Microscope,
Model JEM-2010. Manufacturer: JEOL, Ltd., Japan. Intended Use: See
notice at 63 FR 12452, March 13, 1998. Order Date: December 1, 1997.
Comments: None received. Decision: Approved. No instrument of
equivalent scientific value to the foreign instrument, for such
purposes as these instruments are intended to be used, was being
manufactured in the United States at the time the instruments were
ordered. Reasons: Each foreign instrument is a conventional
transmission electron microscope (CTEM) and is intended for research or
scientific educational uses requiring a CTEM. We know of no CTEM, or
any other instrument suited to these purposes, which was being
manufactured in the United States either at the time of order of each
instrument or at the time of receipt of application by the U.S. Customs
Service.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 98-10412 Filed 4-20-98; 8:45 am]
BILLING CODE 3510-DS-P
