97-13052. Applications for Duty-Free Entry of Scientific Instruments  

  • [Federal Register Volume 62, Number 96 (Monday, May 19, 1997)]
    [Notices]
    [Pages 27236-27237]
    From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
    [FR Doc No: 97-13052]
    
    
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    DEPARTMENT OF COMMERCE
    
    International Trade Administration
    
    
    Applications for Duty-Free Entry of Scientific Instruments
    
        Pursuant to Section 6(c) of the Educational, Scientific and 
    Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
    897; 15 CFR part 301), we invite comments on the question of whether 
    instruments of equivalent scientific value, for the purposes for which 
    the instruments shown below are intended to be used, are being 
    manufactured in the United States.
        Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
    regulations and be filed within 20 days with the Statutory Import 
    Programs Staff, U.S.
    
    [[Page 27237]]
    
    Department of Commerce, Washington, D.C. 20230. Applications may be 
    examined between 8:30 A.M. and 5:00 P.M. in Room 4211, U.S. Department 
    of Commerce, 14th Street and Constitution Avenue, N.W., Washington, 
    D.C.
        Docket Number: 97-031. Applicant: University of Illinois at 
    Chicago, Research Resources Center, 901 S. Wolcott Avenue, Chicago, IL 
    60612-7341. Instrument: Electron Microscope, Model JEM-1220. 
    Manufacturer: JEOL, Ltd., Japan. Intended Use: The article is intended 
    to be used for studies of the molecular architecture of tissues, cells 
    and isolated molecules obtained as part of the experimental data 
    derived from biomedical research projects. The experiments conducted 
    will involve determining structural alterations in cells during 
    different physiological activities and in pathological states. In 
    addition, the instrument will be used for training Ph.D. candidates, 
    postdoctoral fellows and staff in the biomedical field.
        Application accepted by Commissioner of Customs: April 22, 1997.
        Docket Number: 97-032. Applicant: University of Illinois at 
    Chicago, Research Resources Center, 901 S. Wolcott Avenue, Chicago, IL 
    60612-7341. Instrument: Electron Microscope, Model JEM-3010. 
    Manufacturer: JEOL, Ltd., Japan. Intended Use: The instrument will be 
    used for studies of minerals, mineral analogs, materials related to 
    industrial processes, sample interfaces, metals and glass phases of 
    different compounds. Experiments will include: (1) Utilizing image 
    processing and electron diffraction patterns to locate electron 
    densities and (2) examining texture, structural alterations, phase 
    transformation, twinning, polytypism, domains, precipitates, 
    exsolution, deformation defects on microstructure and plasticity, and 
    similar phenomena and processes. In addition, the instrument will be 
    used for training Ph.D. candidates and post-doctoral fellows. 
    Application accepted by Commissioner of Customs: April 22, 1997.
        Docket Number: 97-033. Applicant: Lamont-Doherty Earth Observatory 
    of Columbia University, Rte 9W, Palisades, NY 10964. Instrument: ICP 
    Mass Spectrometer, Model Plasma 54. Manufacturer: VG Elemental, United 
    Kingdom. Intended Use: The instrument will be used for studies of the 
    elemental abundance and isotopic composition of naturally occurring 
    samples, including coral, shell sediments, rocks and natural waters in 
    order to precisely determine the age of the material. Application 
    accepted by Commissioner of Customs: April 24, 1997.
        Docket Number: 97-037. Applicant: University of Illinois at Urbana-
    Champaign, Purchasing Division, 506 South Wright Street, 207 Henry 
    Administration Building, Urbana, IL 61801. Instrument: UHV Evaporators, 
    Models EFM3 and EFM4. Manufacturer: Focus GmbH, Germany. Intended Use: 
    The article is intended to be used on a growth chamber attached to a 
    Low-Energy Electron Microscope. The completed instrument will be used 
    for a variety of studies on the mechanisms of growth of thin films. In 
    particular, there will be studies of magnetic multilayer materials, of 
    the effect of surface steps on film growth and of a technique called 
    convergent beam diffraction, which has not been applied to low energy 
    electrons in the past. Application accepted by Commissioner of Customs: 
    April 30, 1997.
    Frank W. Creel,
    Director, Statutory Import Programs Staff.
    [FR Doc. 97-13052 Filed 5-17-97; 8:45 am]
    BILLING CODE 3510-DS-P
    
    
    

Document Information

Published:
05/19/1997
Department:
International Trade Administration
Entry Type:
Notice
Document Number:
97-13052
Pages:
27236-27237 (2 pages)
PDF File:
97-13052.pdf