97-13335. Applications for Duty-Free Entry of Scientific Instruments  

  • [Federal Register Volume 62, Number 98 (Wednesday, May 21, 1997)]
    [Notices]
    [Page 27722]
    From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
    [FR Doc No: 97-13335]
    
    
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    DEPARTMENT OF COMMERCE
    
    International Trade Administration
    
    
    Applications for Duty-Free Entry of Scientific Instruments
    
        Pursuant to Section 6(c) of the Educational, Scientific and 
    Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
    897; 15 CFR part 301), we invite comments on the question of whether 
    instruments of equivalent scientific value, for the purposes for which 
    the instruments shown below are intended to be used, are being 
    manufactured in the United States.
        Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
    regulations and be filed within 20 days with the Statutory Import 
    Programs Staff, U.S. Department of Commerce, Washington, D.C. 20230. 
    Applications may be examined between 8:30 a.m. and 5:00 p.m. in Room 
    4211, U.S. Department of Commerce, 14th Street and Constitution Avenue, 
    N.W., Washington, D.C.
        Docket Number: 97-035. Applicant: University of Illinois at 
    Chicago, Purchase Order Payables MC 545, 809 S. Marshfield Avenue, 
    Chicago, IL 60612-7272. Instrument: Electron Microscope, Model JEM-
    2010F. Manufacturer: JEOL, Ltd., Japan. Intended Use: The article is 
    intended to be used for the study of the microstructure of metals, 
    metal alloys, ceramics, high-temperature superconductors, 
    semiconductors, polymers, clays, dental implants, soot emissions and 
    proteins. In addition, the instrument will be used on a one-to-one 
    basis for training faculty, staff and graduate students. Application 
    accepted by Commissioner of Customs: April 25, 1997.
    
        Docket Number: 97-036. Applicant: University of Illinois at Urbana-
    Champaign, Purchasing Division, 506 South Wright Street, 207 Henry 
    Administration Building, Urbana, IL 61801. Instrument: Thermal Analysis 
    Mass Spectrometer, Model STA 409. Manufacturer: Netzsch, Germany. 
    Intended Use: The instrument will be used for simultaneous thermal 
    characterization of materials from room temperature up to 2000 deg.C by 
    thermogravimetry, differential thermal analysis or differential 
    scanning calorimetry and evolved gas analysis by mass spectrometry. 
    Application accepted by Commissioner of Customs: April 30, 1997.
    Frank W. Creel,
    Director, Statutory Import Programs Staff.
    [FR Doc. 97-13335 Filed 5-20-97; 8:45 am]
    BILLING CODE 3510-DS-P
    
    
    

Document Information

Published:
05/21/1997
Department:
International Trade Administration
Entry Type:
Notice
Document Number:
97-13335
Pages:
27722-27722 (1 pages)
PDF File:
97-13335.pdf