98-20266. Application for Duty-Free Entry of Scientific Instrument  

  • [Federal Register Volume 63, Number 145 (Wednesday, July 29, 1998)]
    [Notices]
    [Page 40473]
    From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
    [FR Doc No: 98-20266]
    
    
    
    [[Page 40473]]
    
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    DEPARTMENT OF COMMERCE
    
    International Trade Administration
    
    
    Application for Duty-Free Entry of Scientific Instrument
    
        Pursuant to Section 6(c) of the Educational, Scientific and 
    Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
    897; 15 CFR part 301), we invite comments on the question of whether an 
    instrument of equivalent scientific value, for the purposes for which 
    the instrument shown below is intended to be used, is being 
    manufactured in the United States.
        Comments must comply with 15 CFR 301.5(a) (3) and (4) of the 
    regulations and be filed within 20 days with the Statutory Import 
    Programs Staff, U.S. Department of Commerce, Washington, DC 20230. 
    Application may be examined between 8:30 A.M. and 5:00 P.M. in Room 
    4211, U.S. Department of Commerce, 14th Street and Constitution Avenue, 
    NW, Washington, DC.
        Docket Number: 98-035. Applicant: Cornell University, 359 Bard 
    Hall, Ithaca, NY 14853. Instrument: Scanning Tunneling Microscope, 
    Model JAFM-4500XT. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
    instrument will be used for studies of crystalline and amorphous 
    surfaces of insulating and semiconducting materials in an ultrahigh 
    vacuum environment at room and elevated temperatures. Silicate glasses 
    and their related crystalline forms are of particular interest. 
    Investigations will be conducted to determine (a) the microscopic 
    surface structure, (b) the surface chemical variations, (c) how the 
    interactions between surface constituents influence changes in the 
    structure and chemistry when the surface is processed and (d) how the 
    tunneling electron current is influenced by subjecting the surface to 
    electron and photon beams.
    
        Application accepted by Commissioner of Customs: July 15, 1998.
    Frank W. Creel,
    Director, Statutory Import Programs Staff.
    [FR Doc. 98-20266 Filed 7-28-98; 8:45 am]
    BILLING CODE 3510-DS-P
    
    
    

Document Information

Published:
07/29/1998
Department:
International Trade Administration
Entry Type:
Notice
Document Number:
98-20266
Pages:
40473-40473 (1 pages)
PDF File:
98-20266.pdf