94-21120. Wayne State University, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes  

  • [Federal Register Volume 59, Number 165 (Friday, August 26, 1994)]
    [Unknown Section]
    [Page 0]
    From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
    [FR Doc No: 94-21120]
    
    
    [[Page Unknown]]
    
    [Federal Register: August 26, 1994]
    
    
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    DEPARTMENT OF COMMERCE
     
    
    Wayne State University, et al.; Notice of Consolidated Decision 
    on Applications for Duty-Free Entry of Electron Microscopes
    
        This is a decision consolidated pursuant to Section 6(c) of the 
    Educational, Scientific, and Cultural Materials Importation Act of 1966 
    (Pub. L. 89-651, 80 Stat. 897; 15 CFR 301). Related records can be 
    viewed between 8:30 A.M. and 5:00 P.M. in Room 4211, U.S. Department of 
    Commerce, 14th and Constitution Avenue, N.W., Washington, D.C.
        Docket Number: 94-050. Applicant: Wayne State University, Detroit, 
    MI 48201. Instrument: Electron Microscope, Model JEM-1010. 
    Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 59 FR 
    23697, May 6, 1994. Application Accepted by Commissioner of Customs: 
    April 12, 1994.
        Docket Number: 94-054. Applicant: University of South Florida, St. 
    Petersburg, FL 33701. Instrument: Electron Microscope, Model H-7100. 
    Manufacturer: Hitachi Scientific Instruments, Japan. Intended Use: See 
    notice at 59 FR 24690, May 12, 1994. Order Date: July 26, 1993.
        Docket Number: 94-055. Applicant: Virginia Commonwealth University, 
    Richmond, VA 23298-0024. Instrument: Electron Microscope, Model EM 900. 
    Manufacturer: Carl Zeiss, Germany. Intended Use: See notice at 59 FR 
    24691, May 12, 1994. Order Date: January 31, 1994.
        Comments: None received. Decision: Approved. No instrument of 
    equivalent scientific value to the foreign instrument, for such 
    purposes as these instruments are intended to be used, was being 
    manufactured in the United States at the time the instruments were 
    ordered. Reasons: Each foreign instrument is a conventional 
    transmission electron microscope (CTEM) and is intended for research or 
    scientific educational uses requiring a CTEM. We know of no CTEM, or 
    any other instrument suited to these purposes, which was being 
    manufactured in the United States either at the time of order of each 
    instrument or at the time of receipt of application by the U.S. Customs 
    Service.
    Pamela Woods
    Acting Director, Statutory Import Programs Staff
    [FR Doc. 94-21120 Filed 8-25-94; 8:45 am]
    BILLING CODE 3510-DS-F
    
    
    

Document Information

Published:
08/26/1994
Department:
Commerce Department
Entry Type:
Uncategorized Document
Document Number:
94-21120
Dates:
July 26, 1993.
Pages:
0-0 (1 pages)
Docket Numbers:
Federal Register: August 26, 1994