[Federal Register Volume 61, Number 177 (Wednesday, September 11, 1996)]
[Notices]
[Page 47884]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 96-23104]
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DEPARTMENT OF COMMERCE
The Pennsylvania State University et al.; Notice of Consolidated
Decision on Applications, for Duty-Free Entry of Scientific Instruments
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be
viewed between 8:30 A.M. and 5:00 P.M. in Room 4211, U.S. Department of
Commerce, 14th and Constitution Avenue, N.W., Washington, D.C.
Comments: None received. Decision: Approved. No instrument of
equivalent scientific value to the foreign instruments described below,
for such purposes as each is intended to be used, is being manufactured
in the United States.
Docket Number: 96-025. Applicant: The Pennsylvania State
University, State College, PA 16804-0030. Instrument: Mach-Zehnder
Interferometer, Model OP35-I/O. Manufacturer: UltraOptec Inc., Canada.
Intended Use: See notice at 61 FR 28175, June 4, 1996. Reasons: The
foreign instrument provides a dual beam configuration for in- and out-
of-plane displacement in the 10Khz--35Mhz frequency range. Advice
received from: The National Aeronautics and Space Administration, July
29, 1996.
Docket Number: 96-046. Applicant: Smithsonian Institution,
Washington, DC 20560. Instrument: Electron Microprobe, Model JXA-8900R.
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 61 FR
28175, June 4, 1996. Reasons: The foreign instrument provides a high
accuracy element analysis of microareas with (1) a depth of focus of
1mm at magnification of x 100 and (2) secondary electron
image resolution to 5mm. Advice received from: The National Institute
of Standards and Technology, July 25, 1996.
Docket Number: 96-054. Applicant: University of Georgia, Trifton,
GA 31794. Instrument: Ground Conductivity Meter, Model EM38.
Manufacturer: Geonics Ltd., Canada. Intended Use: See notice at 61 FR
30221, June 14, 1996. Reasons: The foreign instrument provides: (1)
rapid survey of soil conductivity patterns by not using ground
electrodes and (2) georeferencing using GPS. Advice received from: The
Department of Agriculture, July 24, 1996.
Docket Number: 96-058. Applicant: American Museum of Natural
History, New York, NY 10024-5192. Instrument: Electron Microprobe,
Model SX 100. Manufacturer: Cameca, France. Intended Use: See notice at
61 FR 33902, July 1, 1996. Reasons: The foreign instrument provides
high accuracy element analysis of microareas with precise point
analysis electron imaging, x-ray mapping and cathodoluminescence.
Advice received from: The National Institute of Standards and
Technology, July 25, 1996.
Docket Number: 96-064. Applicant: University of California, Davis,
Davis, CA 95616. Instrument: Magnetometer and Demagnetizer.
Manufacturer: Molspin Instruments, United Kingdom. Intended Use: See
notice at 61 FR 33903, July 1, 1996. Reasons: The foreign instrument
provides portability and operability in harsh environments to measure
remanent magnetism in rock samples in Antarctica. Advice received from:
The U.S. Geological Survey, August 5, 1996.
The National Aeronautics and Space Administration, the National
Institute of Standards and Technology, the Department of Agriculture
and the U. S. Geological Survey advise that (1) the capabilities of
each of the foreign instruments described above are pertinent to each
applicant's intended purpose and (2) they know of no domestic
instrument or apparatus of equivalent scientific value for the intended
use of each instrument.
We know of no other instrument or apparatus being manufactured in
the United States which is of equivalent scientific value to any of the
foreign instruments.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 96-23104 Filed 9-10-96; 8:45 am]
BILLING CODE 3510-DS-P
