[Federal Register Volume 64, Number 178 (Wednesday, September 15, 1999)]
[Notices]
[Page 50058]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 99-24074]
[[Page 50058]]
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DEPARTMENT OF COMMERCE
International Trade Administration
Applications for Duty-Free Entry of Scientific Instruments
Pursuant to section 6(c) of the Educational, Scientific and
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat.
897; 15 CFR part 301), we invite comments on the question of whether
instruments of equivalent scientific value, for the purposes for which
the instruments shown below are intended to be used, are being
manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the
regulations and be filed within 20 days with the Statutory Import
Programs Staff, U.S. Department of Commerce, Washington, DC 20230.
Applications may be examined between 8:30 a.m. and 5 p.m. in Room 4211,
U.S. Department of Commerce, 14th Street and Constitution Avenue, NW,
Washington, DC.
Docket Number: 99-020. Applicant: National Institutes of Health,
National Institute on Deafness and Other Communication Disorders, 9000
Rockville Pike, Bethesda, MD 20892. Instrument: Electron Microscope,
Model JEM-1010. Manufacturer: JEOL Ltd., Japan. Intended Use: The
instrument is intended to be used for ultrastructural analyses of
animal tissues using electron microscopy preparative techniques such as
fixation, embedding and ultrathin sectioning and immunogold and other
immunocytochemical techniques to localize cellular components and
antigens and computerized imaging quantitation. In addition, the
instrument will be used for training postdoctoral fellows and to some
extent pre-IRTAs and students. Application accepted by Commissioner of
Customs: August 25, 1999.
Docket Number: 99-021. Applicant: University of Kentucky, 177
Anderson Hall, Lexington, KY 40506-0046. Instrument: Electron
Microscope, Model JEM-2010F. Manufacturer: JEOL Ltd., Japan. Intended
Use: The instrument is intended to be used in the study of the
structure and chemistry of a wide variety of materials in the solid
state (e.g., polymers, ceramics, metals, superconductors, carbon
nanotubes) with emphasis on the structure of material defects.
Experiments will include: (1) Quantification of interfacial segregation
in oxide ceramics and correlation of segregation with interface
crystallography, (2) high-resolution imaging of carbon nanotubes, and
(3) phase identification of catalysts. In addition, the instrument will
be used to train graduate students in the theory of electron microscopy
in the courses MSE 858 Material Characterization Techniques and MSE 666
Diffraction Methods in Materials Science. Application accepted by
Commissioner of Customs: August 25, 1999.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 99-24074 Filed 9-14-99; 8:45 am]
BILLING CODE 3510-DS-P
